At Les Houches in January 2015, experts in the field of charged particle trapping came together for the Second Winter School on Physics with Trapped Charged Particles. This textbook collates the lectures delivered there, covering the fundamental physics of particle traps and the different types of applications of these devices.
Taken as a whole, the book gives an overview of why traps for charged particles are important, how they work, their special features and limitations, and their application in areas such as precision measurements, mass spectrometry, optical clocks, plasma physics, antihydrogen creation, quantum simulation and quantum information processing. Chapters from various world experts include those on the basic properties of Penning traps and RF traps, as well as those covering important practical aspects such as vacuum systems, detection techniques, and different types of particle cooling, including laser cooling.
Each individual chapter provides information and guidance on the application of the above methods. Additionally, each chapter is complemented by fully worked problems and solutions, making Trapped Charged Particles perfect for advanced undergraduate and postgraduate students new to this topic.
Contents:Penning TrapsRadiofrequency TrapsThe Guiding Center ApproximationToroidal SystemsUltrahigh Vacuum for Trapped IonsLaser Cooling Techniques Applicable to Trapped IonsNon-Laser Cooling TechniquesNumerical Simulations of Ion Cloud DynamicsPlasmas in Penning TrapsPlasma ModesRotating Wall Technique and Centrifugal SeparationCorrelations in Trapped PlasmaAutoresonanceAntihydrogen PhysicsIon Coulomb Crystals and Their ApplicationsCold Molecular Ions in TrapsPrecise Tests of Fundamental Symmetries with Trapped IonsTrapped-Ion Optical Frequency Standards
Readership: Advanced undergraduate and postgraduate students studying the field of trapped charged particles.
Key Features:The first textbook covering ion traps and their applicationsWritten by world experts on each topicIncludes worked exercises for each topic